Protective Instrument Loop Sensor Group records store details about a protective instrument loop sensor group that you have created as part of SIL verification. This topic provides an alphabetical list and description of the fields that exist for the Protective Instrument Loop Sensor Group family and appear on the Protective Instrument Loop Sensor Group datasheet by default. The information in this table reflects the baseline state and behavior of these fields.
This family is enabled for site filtering, which means that records in this family can be assigned to a specific site, and will then only be accessible to users who are assigned to the same site and have the appropriate license and family privileges. See the Site Filtering section of the documentation for more information on using this feature.
Field | Data Type | Description | Behavior and Usage |
---|---|---|---|
ATI / PVST Automatic/Manual | Character | Indicates whether application testing is automatic or manual. |
You can select one of the following values:
|
ATI / PVST Coverage | Number | The percentage of failures that could be detected by application testing coverage. | None |
ATI / PVST Enabled | Logical |
Indicates if application testing is enabled for the sensors in the group. |
If this field is selected, then the following fields are enabled:
|
ATI / PVST Interval | Number | The interval at which the application testing is performed on the sensors in the group. | None |
ATI / PVST Interval UOM | Character | The units of the application testing interval that you have specified in the ATI / PVST Interval field. |
You can select one of the following values:
|
Availability | Number | A number representing the percentage of time that the sensors in the group are expected to be available in the case of a demand. |
The GE Digital APM system calculates this value automatically as follows: Availability = (1-PFD Avg) *100 |
Calculated PFD Avg | Number | A number representing the probability that the sensor group will fail to react during a demand when the loop is operating in a low demand mode. | This field is disabled. The GE Digital APM system calculates and populates this value. This value depends on the failure rate of the sensor group. |
Calculated PFH | Number | A number representing the probability that the sensor group will fail to react during a demand when the loop is operating in high demand or continuous mode of operation. | This field is disabled. The GE Digital APM system calculates and populates this value. This value depends on the failure rate of the sensor group. |
Calculated STR | Number | A number representing the spurious trip rate for the sensor group. | This field is disabled. The GE Digital APM system calculates and populates this value. |
Common Cause (Beta) | Number | A number representing the percentage of failure that would affect the functioning of multiple devices. For example, a power supply failure for a sensor group that is shared across multiple loops can cause all the loops to fail. In this case, the beta factor is the probability that the loops fail in case of a power supply failure to the sensor group. |
If the value in the Voting field is 1oo1 or 1001D, this value is not applicable. This value is populated when you select a device. |
Custom Vote M | Number | The minimum number of sensors that should trip when the sensor detects a potential hazard. | You must use this option if you want to add more than four sensors in the group. If the number of sensors in the group is less than or equal to four, then this field is disabled and populated with the minimum number of sensors that should trip in the event of a potential hazard (the first digit in the Voting field). |
Custom Vote N | Number | The number of sensors in the group. | You must use this option if you want to add more than four sensors in the group. If the number of sensors in the group is less than or equal to four, then this field is disabled and populated with the number of sensors (the last digit in the Voting field). |
Diverse | Logical | Indicates whether the sensors in the group are similar or diverse. |
If you clear this check box, all the sensors in the group are similar. Hence, all the sensors in the group will have datasheets with the same values, except for the Sensor ID. If you modify the details of a sensor, the same change is reflected in all the sensor datasheets. By default, the check box is cleared. If you select this check box, each sensor in the group will have a datasheet with different values. If there are more than three sensors in the group, this field is cleared. If there is only one sensor in the group, this field is disabled. |
Group ID |
Character |
The ID of the protective instrument loop. |
This value is required and must be unique. The GE Digital APM system provides a default value, which you can modify if required. |
MTTFS | Number | Mean Time To Fail Spuriously. (i.e., Mean time for a sensor to detect a hazard when an unsafe condition is not present.) | This field appears in the Calculated Results section and is disabled. This value is measured in years. |
MTTR | Number | Mean Time To Repair. It is the average time that is required to repair the sensors in the group. | This value is measured in hours and is required. |
Proof Test Coverage | Number | The percentage of failures that are detected by the proof test (i.e., how effectively the proof test identifies failures). For example, 100% proof test coverage indicates that the proof test would identify 100% of the failures that occurred. | This value is required and is set to 0 by default. |
Proof Test Interval | Number | A numeric value representing the frequency at which the proof test should be performed. | This value is set to 12 by default. You can, however, change this value if required. This value is required and is measured in months. |
SIL Architectural Constraints | Number | A number that represents the SIL value for the sensor group, which is based on the architectural constraints that are defined in the Test Architecture Constraints field. | This field is disabled. The GE Digital APM system calculates and populates this value. |
SIL Systematic Capability | Number | A number that represents the SIL value for the sensor group, which is based on the systematic capability that is defined in the Test Architecture Constraints field. | This field is disabled. The GE Digital APM system calculates and populates this value. |
Voting | Character | The voting architecture that represents the minimum number of sensors that should trip (in the event of a failure) and the number of sensors available in the group. For example, if the voting is 1oo2, then for the logic solver to detect a failure, at least one sensor should trip out of the two sensors that are available in the group. |
This field is updated automatically when you add or remove a sensor from the group. The following combinations are available:
This value is required. These values are defined in the MI_SIL_SENSORVOTE system code table. |
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